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News Record

 41st Internepcon Japan

 Exhibition 41st Internepcon Japan

The exhibition is over. Thank you for dropping in.
Please feel free to contact us if you have any inquiry about our products.

Date and time
Jan. 18 (Wed) - Jan. 20 (Fri), 2012
10:00 a.m - 6:00 p.m(Only 20th is until 5:00 p.m)
East Exhibition Hall 5, Tokyo Big Sight, Japan
Concept Pulstec Industrical Co., Ltd will exhibit this exhibition in the Shizuoka prefecture booh. We will propose innovative optical measurement technology based on our experience. Pulstec Industrial Co., Ltd will exhibit in Shizuoka prefecture booth which theme. We look forward to meeting you at the show. Please feel free to contact us if you have any inquiry about our system.
Lineup DUV Wavefront sensor:PWS-1000 DUV
This Sensor can measure the laser source, lens, system which is used for DUV, such as ArF(193nm), KrF(248nm) excimer laser.
Nano Waviness measurement system:LUCAS-Nuk
This measurement system can measure the nanometer size waviness on the wafer or glass surface by checking its reflectivity based on our original sensing method. The system can measure the faster and larger by adopting the large diameter sensor.
Website http://www.nepcon.jp/en/Home/

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