The exhibition is over. Thank you for dropping
in our booth.
Please feel free to contact us if you have any inquiry about
our products.
41st Internepcon
Japan
Date
and time
Jan. 18 (Wed) - Jan. 20 (Fri),
2012
10:00 a.m - 6:00 p.m(Only 20th is until 5:00 p.m)
Location
East Exhibition Hall 5, Tokyo
Big Sight, Japan
Concept
Pulstec
Industrical Co., Ltd will exhibit this exhibition in
the Shizuoka prefecture booh. We will propose innovative
optical measurement technology based on our experience.
Pulstec Industrial Co., Ltd will exhibit in Shizuoka
prefecture booth which theme. We look forward to meeting
you at the show. Please feel free to contact us if you
have any inquiry about our system.
Lineup
DUV
Wavefront sensor:PWS-1000 DUV
This
Sensor can measure the laser source, lens, system which
is used for DUV, such as ArF(193nm), KrF(248nm) excimer
laser.
Nano
Waviness measurement system:LUCAS-Nuk
This
measurement system can measure the nanometer size waviness
on the wafer or glass surface by checking its reflectivity
based on our original sensing method. The system can
measure the faster and larger by adopting the large
diameter sensor.
MEDICA
is the world forum for medicine international trade fair
with congress. Pulstec Industrial Co.,Ltd would like to
introduces "FSCAN" white light scanner for measureing
human body (especially face) in this show. We look forward
to meeting you at the show. Please feel free to contact
us if you have any inquiry about our system.
In
11th International conference on NNT2011, Pulstec make
a presentation of "Fabrication of seamless roll mold
for nano-imprint process" and introduces Nanofabrication
system "NEO-series" in its exhibition.
"e-Document
Japan" is the biggest digital archive related exhibition
in Japan run by Image and Information Management Association
of Japan (JIIMA).
We would like to introduce our error measurement system
to check the optical discs intended for digital archive
based on our long years of experience in optical disc
industry.
InterOpto
is the international trade show that unites advanced technologies
of photonics, optoelectronics and lasers from Japan and
abroad.
Pulstec Industrial Co.,Ltd introduces the optical measurement
and nano-fabrication technology based on our experience.
Please feel free to contact with us if customers have
any customized inspection, measurement, nano-fabrication
request.
The
show (Mediatech) for the evaluation system and production
unit of Blu-RayDisc is held in Hamburg this time.
Pulstec will introduce the BD evaluation system MASTER,
BCA writer, evaluation system ODU-1000 for development,
etc.
Pulstec booth is E47.Please feel free to come and check
our new systems.
The show (Mediatech) for the evaluation
system and production unit of Blu-RayDisc is held in
Macao this time.
Pulstec will introduce the BD evaluation system MASTER,
BCA writer, TE/FE tester, evaluation system ODU-1000
for development, etc.
Moreover, in conference (2nd day), Speech (High speed
Test tool) of our company is also planned.
Please come and join Mediatech in Asia!
Pulstec achieved
shorter evaluation time with the same quality of the current
MASTER system. It is now capable of 2x evaluation!
In addition, Pulstec original board is carried and not only
the evaluation by 2x but the measurement of R,RE Multi Layer
is supported.
NEO
series can draw the nano-scale structure onto the resist on
the object in wide area at high-speed by its rotating unit.
By using the semiconductor laser,the system can be used in the
atmosphere, compact and low cost compared with the conventional
lithography system. Not only the flat surface, it can draw on
the 3D shape object, such as curved or rolling surface, because
of its auto-focusing function
We look forward to meeting you at the show. Please feel free
to contact us if you have any inquiry about our system.
Makuhari
Messe, Chiba, Japan
International Exhibition Hall, International Conference
Hall
Booth No. P-20
Concept
Pulstec
will exhibit NEO-Series at our booth. The system can draw the
um or sub-um-scale dot and line pattern by using the semiconductor
laser and the rotating unit at high speed. In this exhibition,
we will exhibit 3 dimension shape exposing system.
We look forward to meeting you at the show. Please feel free
to contact us if you have any inquiry about our system.
April 22 (Wed) - 23 (Thurs),
2009
April 24 (Fri), 2009
10:00 am - 6:00 pm
9:00 am - 2:00 pm
Location
Forum Messe Frankfurt, Germany
Concept
STAMPER
Checker for BD-ROM is now exhibited. :
The analysis tools of STAMPER for BD-ROM is released. This system
itself is upgraded based on MASTER system. The cover layer issue
is also completed, and it realized repeatability and good correlation.
On the other hand, BCA Writer and Checker System that needed
for BD production in the near future is also carried out. And
also carry out Next Generation Media Evaluation System (Hologram,
Near field and etc.)
Please come and take a look at our new system.
* Replica Disc evaluation is also possible at the show, please
come with some discs.
We look forward to meeting you at the show. Please feel free
to contact us if you have any inquiry about our system.
Lineup
MASTER
STAMPER
Stamper
Checker for BD-ROM, R,RE and Replica disc with 1 system.
Features
•
This system itself is upgraded
based on MASTER system keeping usability.
•
Adopting Spin Coater method
for Cover Layer issue.
Great repeatability is realized.
Application
•
Productive efficiency will
be increasing if possible to check the quality of STAMPER
before replication stage.
We
will be exhibiting a new-type Wavefront Sensor and its applications.
Please take a look at our new model. Free trials are offered
at this time, so please come and visit us!
We look forward to meeting you at Lens Expo. If you have any
inquiry about our product or exhibit, please feel free to contact
us.
Lineup
New-type
Wavefront Sensor: PWS-1000
Pulstec
is the only manufacturer in Japan who possess technology of
Shack-Hartmann method high-speed wavefront sensor. The
conventional type was developed for R&D purpose, meanwhile
the new sensor is aimed at mass-production use.
Features
1
Improvement of data update
speed
2
Wide range of customization
available
3
Improvement of user-friendliness
4
Pursued easy measurement
5
Increased functions and expanded
possibilities
6
Simplified handling of measurement
data
Application
1
Measures wavefront of lens
and other optical components.
2
Compared to conventional
measuring method, it is effective in adjustment process
because of low cost, high resistance to vibration, and
its high-speed measurement.
This
system is to check and adjust lens unit by using Shack-Hartmann
method wavefront sensor.With its high speed and stability, it
is suitable for production line where tact is required. You
can select necessary functions from accessory catalog freely,
so it is easy to change the system set-up. This will offer you
extensibility of the system and we are sure you will be able
to use the system at a long term.
