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Automotive Testing Expo North America 2014
Date and time
Oct. 28 (Tue), 2014, 9:00p.m - 5:00 p.m
Oct. 29 (Wed), 2014, 9:00p.m - 5:00 p.m
Oct. 30 (Thu), 2014, 9:00a.m - 3:00 p.m
Location
Booth#:14030, The Suburban Collection Show place, Novi, MI USA
Lineup Portable X-ray Residual Stress Analyzer: µ-X360
Concept The twelfth Automotive Testing Expo North America brings visitors will be able to see the very latest test technologies and services that are being used in the full automotive production process.
Pulstec will exhibit µ-X360, non-destructive X-ray diffraction(XRD) based stress analyzer.
This small, light-weight, low-cost, low-radiation-dose, fast-cycletime analyzer can measure Residual Stress, FWHM, Retained Austenite by detecting the full Debye ring's profile from single incident X-ray angle.
We are looking forward to meeting you at the show.
Website http://www.testing-expo.com/usa/
 
SEM 2014
Date and time
June 2 (Mon), 2014, 2:30p.m - 4:30 p.m
June 3 (Tue), 2014, 10:30a.m - 4:30 p.m
June 4 (Wed), 2014, 10:00a.m - 12:15 p.m, 1:30p.m - 4:30p. m
Location
Booth 206, Hyatt Regency Greenville, Greenville, South Carolina, USA
Lineup Portable X-ray Residual Stress Analyzer: µ-X360
Concept SEM2014 is an annual conference and exposition of The Society for Experimental Mechanics.
Pulstec will exhibit µ-X360, non-destructive X-ray diffraction(XRD) based stress analyzer.
This small, light-weight, low-cost, low-radiation-dose, fast-cycletime analyzer
can measure Residual Stress, FWHM, Retained Austenite by detecting the full Debye ring's profile from single incident X-ray angle. Ideal to use in a lab and field.
Website http://sem.org/CONF-AC-TOP.asp
 
Analytica
Date and time
April 1 (Tue), 2014, 9:00a.m - 6:00 p.m
April 2 (Wed), 2014, 9:00a.m - 6:00 p.m
April 3 (Thu), 2014, 9:00a.m - 6:00 p.m
April 4 (Fri), 2014, 9:00a.m - 5:00 p.m
Location
Booth:112, Hall A1, Messe Munchen, Germany
Lineup Portable X-ray Residual Stress Analyzer: µ-X360
Concept Analytica has been the leading international fair for state-of-the-art laboratory technology and pioneering biotechnology for 4 decades.
Pulstec Industrial Co.,Ltd. will introduce, the µ-X360, a portable X-ray based residual stress analyzer at this show. The residual stress, FWHM, and the retained austenite can be measured in approx 90secs, and it's truly portable. We are looking forward to meeting you at the show.
Website http://www.analytica.de/en/Home
 
The Advanced Engineering UK 2013
Date and time
Nov. 12 (Tue), 2013, 9:00a.m - 5:00 p.m
Nov. 13 (Wed), 2013, 9:00a.m - 4:00 p.m
Location
Booth:G64, Hall 5, NEC, Birmingham, UK
Lineup Portable X-ray Residual Stress Analyzer: µ-X360
Concept "The Advanced Engineering UK 2013" is one of the most important advanced engineering show. The show is made up of 5 events, "Aero Engineering Show", "Composites Engineering Show", "Automotive Engineering Show", "Auto Engineering Show", and "Printable Electronics for Industry".
Pulstec will introduce our new product, the µ-X360 a portable X-ray based residual stress analyzer at this show. The residual stress, FWHM, and the retained austenite can be measured in approx 90secs, and it's truly portable. We are looking forward to meeting you at the show.
Website http://www.advancedengineeringuk.com/hub/
 
GEAR EXPO
Date and time
Sep. 17 (Tue), 2013 9:00a.m - 6:00 p.m
Sep. 18 (Wed), 2013 9:00a.m - 5:00 p.m
Sep. 19 (Thu), 2013 9:00a.m - 4:00 p.m
Location
Indiana Conventioncenter, Indianapolis, USA
Lineup Portable X-ray Residual Stress Analyzer: µ-X360
Concept Gear Expo is a biennial event and the world's only conference and expo designed exclusively for the gear industry.
Pulstec will introduce our new product, portable x-ray residual stress analyzer, µ-X360. This small, light, low-cost analyzer can measure the stress efficiently by detecting the full Debye ring data from single incident X-ray angle. The analyzer can also measure the FWHM and retained austenite.
We are looking forward to meeting you at the show.
 
PITTCON
Date and time
March 18 (Mon) - 21 (Thu), 2013
Monday - Wednesday: 9:00 a.m - 5:00 p.m, Thursday: 9:00 a.m - 3:00 p.m
Location
Pennsylvania Convention Center, Philadelphia, USA
Lineup Portable X-ray Residual Stress Analyzer: µ-X360
Concept Pittcon is the world largest annual conference and expo for laboratory science. Pulstec will introduce our new product, portable x-ray residual stress analyzer, µ-X360. This small, light, low-cost analyzer can measure the stress efficiently by detecting the full Debye ring data from single incident X-ray angle. We are looking forward to meeting you at the show.
Website http://pittcon.org/
 
MEDTEC JAPAN 2012
Date and time
April 18(Wed), 2012, 10:00a.m - 5:00 p.m
April 19(Thu), 2012, 10:00a.m - 4:00 p.m
Location
Pacifico Yokohama
Concept MEDTEC Japan is the annual event to meet the key design and manufacturing engineers working for medical device manufacturers in Japan. Pulstec will exhibit following products in this exhibition.
Please feel free to contact with us if customers have any requests and interests in our products.
Lineup Fluorescence detection sensor (Reference exhibition)
This sensor optically scan the biological information in the specimen material that includes in the body fluid. The sensor is used for a flow cytemeter, an electrophoresis apparatus, and a fluorescence detector.
We undertake design, prototype manufacturing, and production, according to the customer's request.
Micro plasma module(Reference exhibition)
This small, light‚” module can generate the plasma at low voltage. The equipment is under development, but expect to be effective for sterilisation and skin improvement.
Website http://www.medtecjapan.com/index.php?page=home-en
 
KIMES2012(Korea International Medical & Hospital Equipment Show)
Date and time
Feb. 16 (Thu) - Feb. 19 (Sun), 2012
10:00 a.m - 6:00 p.m
Location
Booth[D-313,3F], COEX, Seoul, Korea
Lineup
High speed 3D human imaging Scanner: FSCAN
Micro plasma sterilize module (Reference exhibition)
Fluorescence detecting head (Reference exhibition)
Concept 28th edition of KIMES 2012 (Korea International Medical & Hospital Equipment Show) will be held in Seoul, Korea.
In this exhibition, we will introduce "FSCAN" (high speed 3D human imaging), "MPM"(Plasma sterilization and skin improvement), and "Fluorescence detecting head"(Gene Fluorescence Detecting Sensor), at JAPAN pavilion organized by JETRO.
Please feel free to visit our booth.
Website http://www.kimes.kr/eng/default.asp
 
41st Internepcon Japan
Date and time
Jan. 18 (Wed) - Jan. 20 (Fri), 2012
10:00 a.m - 6:00 p.m(Only 20th is until 5:00 p.m)
Location
East Exhibition Hall 5, Tokyo Big Sight, Japan
Concept Pulstec Industrical Co., Ltd will exhibit this exhibition in the Shizuoka prefecture booh. We will propose innovative optical measurement technology based on our experience. Pulstec Industrial Co., Ltd will exhibit in Shizuoka prefecture booth which theme. We look forward to meeting you at the show. Please feel free to contact us if you have any inquiry about our system.
Lineup DUV Wavefront sensor:PWS-1000 DUV
This Sensor can measure the laser source, lens, system which is used for DUV, such as ArF(193nm), KrF(248nm) excimer laser.
Nano Waviness measurement system:LUCAS-Nuk
This measurement system can measure the nanometer size waviness on the wafer or glass surface by checking its reflectivity based on our original sensing method. The system can measure the faster and larger by adopting the large diameter sensor.
Website http://www.nepcon.jp/en/Home/

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